Switchable-magnetization planar probe MFM sensor for imaging magnetic textures of complex metal oxide perovskite

We introduce an alternative method for switching-magnetization magnetic force microscopy that utilizes planar tip-on-chip probes. Unlike conventional needle-like tips, the planar probe technique incorporates a microdevice near the tip apex on a 1×1mm2 chip, which allows for thin-film engineering and micro/nano-customization aimed at application-specific tip functionalization. In this study, we establish a microscale current pathway near the tip end to manage the tip magnetization state. This planar probe was used to investigate the intricate disordered magnetic domain structure of an epitaxial thin film of the transition metal oxide perovskite LaMnO3, a material previously demonstrated to exhibit complex domains related to superparamagnetism, antiferromagnetism, and ferromagnetism. We successfully visualized an inhomogeneous distribution of magnetic islands near the Curie temperature, with a resolution exceeding 10nm.