A Sn3Ag–CoSn3 composite copper pillar bump for three-dimensional packaging

Copper pillar bumps are widely utilized in advanced packaging technologies, representing a crucial foundation for 3D packaging. However, the mechanical properties of Sn3Ag bumps on copper columns often fall short of meeting increasingly demanding service conditions. Additionally, the loss of effectiveness due to excessive growth of intermetallic compounds at the interface needs to be addressed. To enhance the Sn₃Ag bumps and inhibit the excessive growth of intermetallic compounds, CoSn₃ nanocrystals were prepared, and Sn₃Ag–CoSn₃ composite copper pillar bumps were fabricated through composite electroplating. Upon reflowing, the CoSn3 nanocrystals decomposed, resulting in a significant formation of (Cu,Co)6Sn5 nanoparticles within the Sn3Ag matrix. The (Cu,Co)6Sn5 nanoparticles not only strengthen the solder joints by pinning, but also significantly reduced the excessive growth of interfacial intermetallic compounds, ultimately improving the service performance and reliability of the solder joints.

Authors

Publication Details

Journal
Journal of Materials Research and Technology
Published
2024-11-01
DOI
https://doi.org/10.1016/j.jmrt.2024.11.063
Citations
1
Primary Topic
Electronic Packaging and Soldering Technologies
Type
article
Field-Weighted Citation Impact
0.21

Funders

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article

A Sn3Ag–CoSn3 composite copper pillar bump for three-dimensional packaging

Zengxi Pan, Ziwen Lv, Mingyuan Zhao, Y. H. Chen et al.
1 citations
Journal of Materials Research and Technology
Electronic Packaging and Soldering Technologies
0.21
article

A Sn3Ag–CoSn3 composite copper pillar bump for three-dimensional packaging

Zengxi Pan, Ziwen Lv, Mingyuan Zhao, Y. H. Chen, Hongbo Xü, Guangjian Peng, Mingyu Li, Jintao Wang, Hongtao Chen, Feng Tian, Xiaoyu Han
article en
1 citations

Abstract

Copper pillar bumps are widely utilized in advanced packaging technologies, representing a crucial foundation for 3D packaging. However, the mechanical properties of Sn3Ag bumps on copper columns often fall short of meeting increasingly demanding service conditions. Additionally, the loss of effectiveness due to excessive growth of intermetallic compounds at the interface needs to be addressed. To enhance the Sn₃Ag bumps and inhibit the excessive growth of intermetallic compounds, CoSn₃ nanocrystals were prepared, and Sn₃Ag–CoSn₃ composite copper pillar bumps were fabricated through composite electroplating. Upon reflowing, the CoSn3 nanocrystals decomposed, resulting in a significant formation of (Cu,Co)6Sn5 nanoparticles within the Sn3Ag matrix. The (Cu,Co)6Sn5 nanoparticles not only strengthen the solder joints by pinning, but also significantly reduced the excessive growth of interfacial intermetallic compounds, ultimately improving the service performance and reliability of the solder joints.

Journal of Materials Research and TechnologyVol. 33
State Key Laboratory of Advanced Welding and Joining
Openalex Percentile: Top 46%
Electronic Packaging and Soldering Technologies
0.21
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