Photoassisted electron emission from planar-type electron source based on graphene/oxide/silicon structure
This paper reports on photoassisted electron emission from a planar-type electron emission source based on a graphene/oxide/p-Si structure under visible laser light irradiation. The electron source is expected to be useful as a photocathode with a high quantum efficiency and an ultrafast pulsed electron beam. The electron emission efficiency is found to be 12%, independent of laser light irradiation. Without a negative electron affinity surface, the emission current generated by irradiation shows an increase of several orders of magnitude compared with that in the dark, and a quantum efficiency of 0.3% is achieved. This electron source exhibits advanced photoassisted electron emission characteristics with high photosensitivity in the order of milliamps per watt. The photoassisted emission from the device shows a photoresponse with a rise and fall time of 70 μs at a wavelength of 633 nm, which is determined by the diffusion process of photoexcited electrons in the bulk. The use of a heavily doped p-type silicon substrate provides a practical route for further improvement.
Authors
- H. Shimawaki (ORCID: https://orcid.org/0000-0001-6780-5274)
- Masayoshi Nagao (ORCID: https://orcid.org/0000-0002-2862-8321)
- K. Murakami (ORCID: https://orcid.org/0000-0001-5999-5581)
Institutions
- Hachinohe Institute of Technology (JP)
- National Institute of Advanced Industrial Science and Technology (JP)
Publication Details
- Journal
- Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena
- Published
- 2024-11-13
- DOI
- https://doi.org/10.1116/6.0004094
- Primary Topic
- Photocathodes and Microchannel Plates
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Japan Society for the Promotion of Science