Synchrotron-based Characterization Techniques for Radiation Detection Materials and Devices: An Overview

High-performance room-temperature radiation detectors (high energy resolution for spectrometers, high spatial resolution for imaging devices, and low defect-density for high flux applications) are needed for photon energies (>20 keV) that are not well suited for silicon detectors.Applications for such radiation detectors include nonproliferation, synchrotron, medical, astrophysics, and homeland security.Material-and device-characterization to understand and solve the limiting factors of radiation detection materials and devices is a core element of a radiation detector development R&D program.This presentation will give an overview on the two main synchrotron-based characterization techniques that have been employed by the authors in the last ~20 years: (1) White Beam X-ray Diffraction Topography and (2) Micron-scale detector mapping.A perfect (one domain) crystal (radiation detection material) is a requirement to achieve a highperformance radiation detector.White Beam X-ray Diffraction Topography (WBXDT) allows the rapid screening of the crystallinity of the detector material.With WBXDT we can quickly screen CZT and other crystals to make sure they have only one domain, and to see the presence of extended defects and strain fields.Perfect crystal: the WBXDT image is the replica of the crystal geometry WBXDT image WBXDT image CZT crystal CZT crystal Imperfect crystal: Excellent response detector Poor response detectorTo which extent?