Diamond-BN Heterojunctions for High Power Devices: The Ultimate HEMT?
This review explores the properties of diamond and boron nitride as a promising materials combination for high electron mobility transistors, HEMTs. These ultra-wide bandgap materials exhibit excellent electronic properties as well as high thermal conductivity for superior heat dissipation. The lattice mismatch between cubic boron nitride (c-BN) and diamond is $\sim \mathbf{1. 4 \%}$ allowing for the epitaxial growth of heterojunction devices. However, to demonstrate a viable c-BN/diamond HEMT technology a number of significant challenges remain, including: the epitaxial growth of single crystal heterojunctions on large area substrates; control of phosphorus dopant incorporation for n-type channels; and achieving low specific contact resistance to source and drain regions. There has been recent progress towards achieving these goals, paving the way for a new generation of high-power electronic devices for DC and RF applications.
Authors
- R. J. Nemanich (ORCID: https://orcid.org/0000-0003-3576-8178)
- T. J. Thornton (ORCID: https://orcid.org/0000-0003-1220-5399)
- Stephen M. Goodnick (ORCID: https://orcid.org/0000-0002-2026-6274)
- T. L. Alford (ORCID: https://orcid.org/0000-0001-8528-3019)
- Ankita Ankita
- Ali Ebadi Yekta (ORCID: https://orcid.org/0009-0004-2760-0492)
- Mihilat Manahile
- Shih-Chun Tsu
Institutions
- Arizona State University (US)
Publication Details
- Published
- 2024-10-27
- DOI
- https://doi.org/10.1109/bcicts59662.2024.10745655
- Primary Topic
- Semiconductor materials and devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Science Foundation