Single-Chip 30 GHz SiGe Sub-Sampling PLL with 28.3 fs Jitter
We demonstrate a phase locked loop (PLL) in a 45 nm PDSOI process with SiGe heterojunction bipolar devices (HBTs). The PLL has an output frequency centered around 30 GHz and exhibits low jitter and in-band phase noise. Measurements demonstrate -100.9 / -116.6 / -126.9 dBc/Hz phase noise at 1 kHz / 1 MHz / 10 MHz offsets, with integrated jitter of 28.3 fs (rms). It combines the far-out low phase noise performance of a SiGe HBT LC-VCO with a sub-sampling loop that significantly reduces the in-band noise contribution from loop filter components. The 45 nm PDSOI FETs enable sub-sampling bandwidth over 30 GHz. The loop filter features a wide degree of tunability, enabling optimization of in-band and far-out phase noise.
Authors
- Dimitre Dimitrov (ORCID: https://orcid.org/0000-0001-5451-1189)
- Steven Eugene Turner (ORCID: https://orcid.org/0000-0002-5013-6382)
- Spencer Desrochers
- Daniel Lacroix
- Matthew L Speir (ORCID: https://orcid.org/0000-0002-2035-1129)
- Mark D. Hickle (ORCID: https://orcid.org/0000-0002-8212-6445)
- Robert Sepanek
- S. Srinivas (ORCID: https://orcid.org/0000-0002-8038-0028)
- Joseph M. Krzyzek
Institutions
- BAE Systems (United States) (US)
Publication Details
- Published
- 2024-10-27
- DOI
- https://doi.org/10.1109/bcicts59662.2024.10745698
- Primary Topic
- Advancements in PLL and VCO Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00