Trends in Millimeter-Wave and THz Test Equipment
This brief survey looks at some current challenges and advances in millimeter-wave and THz test equipment. In particular, spectral purity of mm-wave signal sources and downconverters is addressed, both at full power and in power-sweeping configurations. Higher-power VNA measurement capabilities are introduced. New advances in millimeter-wave noise measurements and wideband signal analysis are also described.
Authors
- Jeffrey L. Hesler (ORCID: https://orcid.org/0000-0001-7011-8854)
- Eric Bryerton (ORCID: https://orcid.org/0000-0001-7424-5308)
Institutions
- Virginia Diodes (United States) (US)
Publication Details
- Published
- 2024-10-27
- DOI
- https://doi.org/10.1109/bcicts59662.2024.10745721
- Primary Topic
- Microwave Engineering and Waveguides
- Type
- article
- Field-Weighted Citation Impact
- 0.00