A Novel Defect Segmentation Model via Integrating Enhanced U-Net with Convolutional Block Attention Mechanisms

Abstract. Defect segmentation in industrial quality control is pivotal for maintaining high product surface standards, but it remains a challenge due to complex defect patterns and varying backgrounds. Traditional segmentation methods often struggle with sensitivity and specificity, leading to either missed defects or false positives. In order to address the above issues this paper presents an advanced defect segmentation model that integrates a Convolutional Block Attention Module (CBAM) with an enhanced U-Net architecture. Our method leverages the spatial and channel-wise attention mechanisms to focus more accurately on subtle defects and remove background interference, enhancing the discriminative power of the feature maps generated by the U-Net. Experimental results on SD-saliency-900 industrial datasets demonstrate significant improvements in segmentation accuracy and robustness compared to existing state-of-the-art methods, confirming the effectiveness of integrating attention mechanisms in deep learning models for complex defect segmentation tasks. Specifically, our model achieved a mean Intersection over Union (mIoU) of 0.87, which is an increase of 5% over the traditional U-Net model and a 4% improvement compared to the DeepLabv3+ model. These results indicate a substantial enhancement in defect detection performance, validating the superiority of our approach.