Precision compensation method for large-scale measurements based on full-space refractive index field reconstruction with vibratory mirror background oriented schlieren (VMBOS)

With the development of the large-scale equipment manufacturing industry, such as aircraft component assembly, wind turbine rotor blade measurement and large ship assembly the demand for optical measurement accuracy in large-dimensional spaces within industrial environments has become increasingly stringent. However, due to the presence of internal interference sources, light will no longer propagate in a straight line, thereby introducing measurement errors that cannot be ignored. To compensate for the measurement error, the refractive index field distribution within the large-dimensional measurement space must be reconstructed. Therefore, this paper proposed a vibratory mirror background oriented schlieren (VMBOS) based on vibratory scanning. This method scans the measurement space through the rotation of vibratory mirror to obtain light deflection angles at different directions. Subsequently, the refractive index field of the large-dimensional space is reconstructed by using the tomographic reconstruction algorithm. Then the optical path of the light in the optical measurement can be corrected through the Hamiltonian ray tracing algorithm, thereby achieving compensation for the measurement error. Finally, the VMBOS method has been verified through both simulation and experimental methods. The experimental results demonstrated that the method proposed in this paper can be applied to optical path correction and error compensation in large scale spaces.

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Publication Details

Journal
Optics Express
Published
2024-11-11
DOI
https://doi.org/10.1364/oe.540033
Citations
3
Primary Topic
Advanced Measurement and Metrology Techniques
Type
article
Field-Weighted Citation Impact
0.64

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Precision compensation method for large-scale measurements based on full-space refractive index field reconstruction with vibratory mirror background oriented schlieren (VMBOS)

Chenping Zhang, Jiusheng Chen, Runxia Guo, Zhixiang Pan et al.
3 citations
Optics Express
Advanced Measurement and Metrology Techniques
0.64
article

Precision compensation method for large-scale measurements based on full-space refractive index field reconstruction with vibratory mirror background oriented schlieren (VMBOS)

Chenping Zhang, Jiusheng Chen, Runxia Guo, Zhixiang Pan, Zhen Zhang, Jun Wu, Zhiwei Xing
article en
3 citations

Abstract

With the development of the large-scale equipment manufacturing industry, such as aircraft component assembly, wind turbine rotor blade measurement and large ship assembly the demand for optical measurement accuracy in large-dimensional spaces within industrial environments has become increasingly stringent. However, due to the presence of internal interference sources, light will no longer propagate in a straight line, thereby introducing measurement errors that cannot be ignored. To compensate for the measurement error, the refractive index field distribution within the large-dimensional measurement space must be reconstructed. Therefore, this paper proposed a vibratory mirror background oriented schlieren (VMBOS) based on vibratory scanning. This method scans the measurement space through the rotation of vibratory mirror to obtain light deflection angles at different directions. Subsequently, the refractive index field of the large-dimensional space is reconstructed by using the tomographic reconstruction algorithm. Then the optical path of the light in the optical measurement can be corrected through the Hamiltonian ray tracing algorithm, thereby achieving compensation for the measurement error. Finally, the VMBOS method has been verified through both simulation and experimental methods. The experimental results demonstrated that the method proposed in this paper can be applied to optical path correction and error compensation in large scale spaces.

Optics ExpressVol. 32(25)
Tianjin University (CN), Civil Aviation University of China (CN)
National Natural Science Foundation of China, Tianjin Science and Technology Program
Openalex Percentile: Top 35%
Advanced Measurement and Metrology Techniques
0.64
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