A Robust Low‐Power Power‐On‐Reset Circuit With Dual Threshold Method

ABSTRACT In this paper, a robust low‐power power‐on‐reset (POR) circuit with dual threshold method is proposed. The current‐based circuit exhibits good robustness with respect to process, voltage, temperature, and supply ramp variations. In contrast to conventional delay‐based pulse generation approaches, a dual threshold method is introduced to generate POR and brown‐out‐reset (BOR) pulse signals, resulting in ultralow quiescent current and a compact area. Implemented in the 55‐nm CMOS process, the proposed circuit achieves an accurate trigger‐point voltage with a temperature coefficient of 90.4 ppm/°C and a deviation to the ramp time of 2.9% for a range from 100 μs to 1 s. Furthermore, the quiescent current and active area are 0.3 nA and 4834 μm 2 , respectively, making it particularly suitable for energy harvesting systems.