Optimization Design of Pt/C Multilayer Supermirrors for Hard X-rays

Aperiodic multilayers have important applications in hard X-rays astronomical observations due to their broadband responses. This paper presents an optimization model of Pt/C power-law graded stack multilayers using the IMD software. The reflectivity expression of multilayers was derived from the reflection theory of X-ray multilayers and Fresnel recursion formulas. Then, the effects of maximum bi-layer thickness ([Formula: see text]), ratio of high-density material thickness to bi-layer thickness ([Formula: see text]), power-law index ([Formula: see text]), number of bi-layers ([Formula: see text]), grazing incidence angle ([Formula: see text]), interfacial roughness ([Formula: see text]), and photon energy ([Formula: see text]) on the reflectivity were analyzed. The calculation results showed that the [Formula: see text], [Formula: see text] and [Formula: see text] control the shift of response range, absorption peak and Bragg peaks, respectively. And the decrease of [Formula: see text] and increase of [Formula: see text] and [Formula: see text] can result in the reduction of reflectivity at different energies. Additionally, an optimized multilayer structure was proposed according to the extremum of merit function, which can achieve a broadband reflectivity of no less than 0.6 from 1[Formula: see text]keV up to 80[Formula: see text]keV. These results can provide important references for the response characteristic analysis and optimization design of multilayers.

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Journal
NANO
Published
2024-11-08
DOI
https://doi.org/10.1142/s1793292024501790
Primary Topic
Advanced Materials Characterization Techniques
Type
article
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article

Optimization Design of Pt/C Multilayer Supermirrors for Hard X-rays

Qingyong Zhou, Lizhi Sheng, Pengfei Qiang, Yongqing Yan et al.
NANO
Advanced Materials Characterization Techniques
article

Optimization Design of Pt/C Multilayer Supermirrors for Hard X-rays

Qingyong Zhou, Lizhi Sheng, Pengfei Qiang, Yongqing Yan, Renzhou Zheng, Yue Li
article en

Abstract

Aperiodic multilayers have important applications in hard X-rays astronomical observations due to their broadband responses. This paper presents an optimization model of Pt/C power-law graded stack multilayers using the IMD software. The reflectivity expression of multilayers was derived from the reflection theory of X-ray multilayers and Fresnel recursion formulas. Then, the effects of maximum bi-layer thickness ([Formula: see text]), ratio of high-density material thickness to bi-layer thickness ([Formula: see text]), power-law index ([Formula: see text]), number of bi-layers ([Formula: see text]), grazing incidence angle ([Formula: see text]), interfacial roughness ([Formula: see text]), and photon energy ([Formula: see text]) on the reflectivity were analyzed. The calculation results showed that the [Formula: see text], [Formula: see text] and [Formula: see text] control the shift of response range, absorption peak and Bragg peaks, respectively. And the decrease of [Formula: see text] and increase of [Formula: see text] and [Formula: see text] can result in the reduction of reflectivity at different energies. Additionally, an optimized multilayer structure was proposed according to the extremum of merit function, which can achieve a broadband reflectivity of no less than 0.6 from 1[Formula: see text]keV up to 80[Formula: see text]keV. These results can provide important references for the response characteristic analysis and optimization design of multilayers.

NANOVol. 20(13)
Xi'an Institute of Optics and Precision Mechanics (CN), State Key Laboratory of Chemical Engineering (CN)
Openalex Percentile: Top 82%
Advanced Materials Characterization Techniques
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