Optimization Design of Pt/C Multilayer Supermirrors for Hard X-rays
Aperiodic multilayers have important applications in hard X-rays astronomical observations due to their broadband responses. This paper presents an optimization model of Pt/C power-law graded stack multilayers using the IMD software. The reflectivity expression of multilayers was derived from the reflection theory of X-ray multilayers and Fresnel recursion formulas. Then, the effects of maximum bi-layer thickness ([Formula: see text]), ratio of high-density material thickness to bi-layer thickness ([Formula: see text]), power-law index ([Formula: see text]), number of bi-layers ([Formula: see text]), grazing incidence angle ([Formula: see text]), interfacial roughness ([Formula: see text]), and photon energy ([Formula: see text]) on the reflectivity were analyzed. The calculation results showed that the [Formula: see text], [Formula: see text] and [Formula: see text] control the shift of response range, absorption peak and Bragg peaks, respectively. And the decrease of [Formula: see text] and increase of [Formula: see text] and [Formula: see text] can result in the reduction of reflectivity at different energies. Additionally, an optimized multilayer structure was proposed according to the extremum of merit function, which can achieve a broadband reflectivity of no less than 0.6 from 1[Formula: see text]keV up to 80[Formula: see text]keV. These results can provide important references for the response characteristic analysis and optimization design of multilayers.
Authors
- Qingyong Zhou
- Lizhi Sheng (ORCID: https://orcid.org/0000-0002-1010-6170)
- Pengfei Qiang
- Yongqing Yan
- Renzhou Zheng (ORCID: https://orcid.org/0009-0008-7365-0553)
- Yue Li (ORCID: https://orcid.org/0000-0001-5808-6095)
Institutions
- Xi'an Institute of Optics and Precision Mechanics (CN)
- State Key Laboratory of Chemical Engineering (CN)
Publication Details
- Journal
- NANO
- Published
- 2024-11-08
- DOI
- https://doi.org/10.1142/s1793292024501790
- Primary Topic
- Advanced Materials Characterization Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00