High-resolution polarization-dependent loss measurement using microwave photonics

We propose a novel Polarization-Dependent Loss (PDL) measurement method to achieve optical device polarization characterization. The method utilizes high-fineness frequency sweeping based on Microwave Photonics (MWP) to achieve high frequency resolution. Theoretically, a sub-Hz frequency resolution is available. In the experiment, the stimulated Brillouin scattering (SBS) in a 5-km single-mode fiber serves as the device under test (DUT). The PDL is measured with a frequency resolution as high as 100 kHz over a frequency span of 400 MHz, demonstrating the advantages of high frequency resolution.