Analysis of uncertainty in measurement of electron temperature in low-pressure inductively coupled plasmas using microwave cutoff probe
Abstract In this study, we performed electron temperature measurements by using a square cutoff probe (CP). Further, the measurement uncertainty was comprehensively analysed. The square CP allows for the measurement of the electron temperature based on the measured electron series resonance frequency and that of the electron plasma frequency based on the transmission spectrum of the plasma. The electron temperatures were determined under varying gas pressures and input power conditions, and the results were compared with those obtained using a single Langmuir probe. Also, the impact of electron-neutral collision frequency on electron temperature measurement using square CP was analysed based on a plasma equivalent circuit model. The square CP is expected to serve as a valuable diagnostic tool for the precise characterization of electron temperature, offering localized, accurate, and easily interpretable features.
Authors
- Jung‐Hyung Kim (ORCID: https://orcid.org/0000-0002-7197-6073)
- Gwang-Seok Chae (ORCID: https://orcid.org/0000-0003-1364-6671)
- Hyo‐Chang Lee (ORCID: https://orcid.org/0000-0003-2754-1512)
- Hee-Jung Yeom (ORCID: https://orcid.org/0000-0002-8101-6041)
Institutions
- Korea Aerospace University (KR)
- Korea Research Institute of Standards and Science (KR)
Publication Details
- Journal
- Plasma Sources Science and Technology
- Published
- 2024-11-01
- DOI
- https://doi.org/10.1088/1361-6595/ad9054
- Citations
- 2
- Primary Topic
- Plasma Diagnostics and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.42
Funders
- Ministry of Trade, Industry and Energy
- Korea Research Institute of Standards and Science
- National Research Foundation of Korea
- National Research Council of Science and Technology
- Korea Semiconductor Research Consortium
- Korea Evaluation Institute of Industrial Technology