Position-independent product increase rate in a shaker mill revealed by position-resolved <i>in situ</i> synchrotron powder X-ray diffraction

We investigated the position and time dependence of a mechanochemical reaction induced by ball milling using in situ synchrotron powder X-ray diffraction with changing X-ray irradiation position. The mechanochemical reduction of AgCl with Cu was monitored in situ with the X-rays incident at two different vertical positions on the jar. Our previously developed multi-distance Rietveld method was applied to analyze the in situ diffraction data with a 1 min resolution. Both the vertical and the horizontal sample positions were determined using the sample-to-detector distances from the in situ data. Position dependence was found in the powder spreading and induction time. We reveal that the increase rate of the product is independent of the sample position when measured with a 1 min time resolution, confirming the validity of in situ monitoring of part of the space in a milling jar for a gradual mechanochemical reaction.

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Publication Details

Journal
Journal of Applied Crystallography
Published
2024-11-08
DOI
https://doi.org/10.1107/s1600576724010057
Primary Topic
Mineral Processing and Grinding
Type
article
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article

Position-independent product increase rate in a shaker mill revealed by position-resolved in situ synchrotron powder X-ray diffraction

Hidetaka Kasai, Eiji Nishibori
Journal of Applied Crystallography
Mineral Processing and Grinding
article

Position-independent product increase rate in a shaker mill revealed by position-resolved in situ synchrotron powder X-ray diffraction

Hidetaka Kasai, Eiji Nishibori
article en

Abstract

We investigated the position and time dependence of a mechanochemical reaction induced by ball milling using in situ synchrotron powder X-ray diffraction with changing X-ray irradiation position. The mechanochemical reduction of AgCl with Cu was monitored in situ with the X-rays incident at two different vertical positions on the jar. Our previously developed multi-distance Rietveld method was applied to analyze the in situ diffraction data with a 1 min resolution. Both the vertical and the horizontal sample positions were determined using the sample-to-detector distances from the in situ data. Position dependence was found in the powder spreading and induction time. We reveal that the increase rate of the product is independent of the sample position when measured with a 1 min time resolution, confirming the validity of in situ monitoring of part of the space in a milling jar for a gradual mechanochemical reaction.

Journal of Applied CrystallographyVol. 57(6)
University of Tsukuba (JP)
Openalex Percentile: Top 80%
Mineral Processing and Grinding
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Position-independent product increase rate in a shaker mill revealed by position-resolved <i>in situ</i> synchrotron powder X-ray diffraction — Hidetaka Kasai, Eiji Nishibori · Journal of Applied Crystallography (2024) | TGRS Research Map | TGRS