Electron microscopists tackle fragile samples

A new scanning transmission electron microscope (STEM) technique allows images to be formed with the fewest electrons possible.

Authors

Publication Details

Journal
Physics World
Published
2024-10-01
DOI
https://doi.org/10.1088/2058-7058/37/10/06
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
Field-Weighted Citation Impact
0.00
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article

Electron microscopists tackle fragile samples

Tim Wogan
Physics World
Electron and X-Ray Spectroscopy Techniques
article

Electron microscopists tackle fragile samples

Tim Wogan
article en

Abstract

A new scanning transmission electron microscope (STEM) technique allows images to be formed with the fewest electrons possible.

Physics WorldVol. 37(10)
Openalex Percentile: Top 81%
Electron and X-Ray Spectroscopy Techniques
DOISourceOpenAlex
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Electron microscopists tackle fragile samples — Tim Wogan · Physics World (2024) | TGRS Research Map | TGRS