The Study of the Impact of Structural Defects in Electronic Components on Their Mechanical Amplitude-Frequency Characteristics
In recent years, radio electronics technology has made significant advancements, with increasing demands for accuracy and stable performance under all operational conditions. To achieve this, the production process of radio electronics equipment must ensure precision in both the physical structure and technical parameters of electronic components. By implementing structural mathematical models during the design phase for various technical conditions of the product, the effectiveness of diagnosing potential defects during manufacturing and operation can be enhanced. Based on the development of known methods, a new non-destructive diagnostic method has been proposed: using shock effect simulation integrated into the design phase of spacecraft radio electronics modules (SREM) to assess the presence of defects. Products that operate well or with specific defects will exhibit different frequency amplitude characteristics. This parameter allows for the development of a mathematical model to evaluate the technical condition of the SREM without the need for disassembly and reassembly of the equipment for diagnosis. Finally, experimental data on the effects observed in SREM blocks are compared with simulated data on potential defect scenarios. The results provide a report on specific defects or the absence of defects, based on values corresponding to frequency amplitude characteristics.
Authors
- Saygid U. Uvaysov (ORCID: https://orcid.org/0000-0003-1943-6819)
- Ruslan M. Uvaysov
- Hai Nguyen (ORCID: https://orcid.org/0000-0003-3960-2108)
- Aleksey V. Dolmatov (ORCID: https://orcid.org/0000-0003-2969-2971)
- Vo The Hai
- Pham Xuan Hanh
Institutions
- MIREA - Russian Technological University (RU)
Publication Details
- Published
- 2024-10-02
- DOI
- https://doi.org/10.1109/sed63331.2024.10741058
- Primary Topic
- Industrial Engineering and Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00