Method of Simulated Annealing in the Problems of Diagnostics of Linear Radio Electronic Circuits Using the Lie Hypothesis

In recent years, the problem of diagnosing defects in radio-electronic circuits has become highly relevant. Developing a method capable of diagnosing a faulty component and determining its parameter value in radio-electronic circuits, especially when there are a large number of components in the circuit, is a complex task. Optimization algorithms, particularly the simulated annealing algorithm, have found wide application and are very effective for optimization tasks. The application of this algorithm to the problem of fault diagnosis in radioelectronic circuits has not been studied. In this article, we use the simulated annealing algorithm in combination with Lee’s hypothesis to develop a new modification that can diagnose faulty components in radio-electronic circuits. This new modification works well, and we have proven it below.