Enhancing single-molecule localization microscopy with deep learning

Single-molecule localization microscopy (SMLM) has significantly improved the visualization of sub-cellular structures, but enhancing the accuracy of 3D emitter localization remains challenging. The technique relies on precisely computationally localizing sparsely activated fluorophores, with traditional methods being iterative, time-consuming, and sensitive to camera noise and overlapping point spread functions (PSFs). We introduce a deep convolutional neural network that employs an innovative architecture to effectively manage diverse emitter scenarios, from isolated to densely packed. By transforming features from the real to the complex domain to integrate axial and lateral spatial information, our method outperforms existing deep learning-based localization algorithms. Tested on simulated SMLM frames with densities up to 2.0µm<sup>-2</sup>, our approach demonstrates superior performance across varying emitter densities and signal-to-noise ratios, maintaining high accuracy even under challenging conditions.

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Publication Details

Journal
Applied Optics
Published
2024-11-07
DOI
https://doi.org/10.1364/ao.539076
Citations
2
Primary Topic
Advanced Fluorescence Microscopy Techniques
Type
article
Field-Weighted Citation Impact
1.32
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article

Enhancing single-molecule localization microscopy with deep learning

Craig Snoeyink, Armin Abdehkakha, S. Madani
2 citations
Applied Optics
Advanced Fluorescence Microscopy Techniques
1.32
article

Enhancing single-molecule localization microscopy with deep learning

Craig Snoeyink, Armin Abdehkakha, S. Madani
article en
2 citations

Abstract

Single-molecule localization microscopy (SMLM) has significantly improved the visualization of sub-cellular structures, but enhancing the accuracy of 3D emitter localization remains challenging. The technique relies on precisely computationally localizing sparsely activated fluorophores, with traditional methods being iterative, time-consuming, and sensitive to camera noise and overlapping point spread functions (PSFs). We introduce a deep convolutional neural network that employs an innovative architecture to effectively manage diverse emitter scenarios, from isolated to densely packed. By transforming features from the real to the complex domain to integrate axial and lateral spatial information, our method outperforms existing deep learning-based localization algorithms. Tested on simulated SMLM frames with densities up to 2.0µm<sup>-2</sup>, our approach demonstrates superior performance across varying emitter densities and signal-to-noise ratios, maintaining high accuracy even under challenging conditions.

Applied OpticsVol. 64(5)
University at Buffalo, State University of New York (US)
Openalex Percentile: Top 14%
Advanced Fluorescence Microscopy Techniques
1.32
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