Plasma Treatment Technologies for GaN Electronics
Nowadays, the third-generation semiconductor led by GaN has brought great changes to the semiconductor industry. Utilizing its characteristics of a wide bandgap, high breakdown Electric field, and high electron mobility, GaN material is widely applied in areas such as 5G communication and electric vehicles to improve energy conservation and reduce emissions. However, with the progress in the development of GaN electronics, surface and interface defects have become a main problem that limits the further promotion of their performance and stability, increasing leakage current and causing degradation in breakdown voltage. Thus, to reduce the damage, Plasma treatment technologies are introduced in the fabrication process of GaN electronics. Up to now, designs like the high-resistivity p-GaN cap Layer, passivating termination, and surface recovery process have been established via Plasma treatment, reaching the goals of normally-off transistors, diodes with high breakdown voltage and high-reliability GaN electronics, etc. In this article, hydrogen, fluorine, oxygen, and nitrogen Plasma treatment technologies will be discussed, and their application in GaN electronics will be reviewed and compared.
Authors
- Yong Cai (ORCID: https://orcid.org/0000-0001-9849-0658)
- Yuji Zhao (ORCID: https://orcid.org/0000-0001-9199-4159)
- Imteaz Rahaman (ORCID: https://orcid.org/0000-0002-2567-0559)
- Kai Fu (ORCID: https://orcid.org/0000-0002-9405-7512)
- Houqiang Fu (ORCID: https://orcid.org/0000-0002-1125-8328)
- Hunter D. Ellis (ORCID: https://orcid.org/0000-0003-0226-5240)
- Baoshun Zhang (ORCID: https://orcid.org/0000-0002-7289-2883)
- Botong Li (ORCID: https://orcid.org/0009-0001-7772-5419)
Institutions
- University of Science and Technology of China (CN)
- Chinese Academy of Sciences (CN)
- University of Utah (US)
- Suzhou Institute of Nano-tech and Nano-bionics (CN)
- Arizona State University (US)
- Rice University (US)
Publication Details
- Journal
- Electronics
- Published
- 2024-11-06
- DOI
- https://doi.org/10.3390/electronics13224343
- Citations
- 3
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.93
Funders
- Applied Materials
- Key Research and Development Program of Jiangxi Province
- Defense Advanced Research Projects Agency