An Optimized Ultrasonic Spray Pyrolysis Device for The Production of Metal Oxide Films and Their Morfology

In this work, we developed an optimized ultrasonic spray pyrolysis device for obtaining metal oxide films. The key benefit of this facility lies in its cost-effectiveness and its ability to consistently coat extensive surfaces without sacrificing the integrity of the semi-conductive films, thus streamlining the manufacturing process of semiconductor films. The resulting films exhibit the following attributes: the thickness of the deposited layer is approximately 400 nm, while the diameters of ZnO1-xSx nanocrystals range from 50 to 200 nm, oriented perpendicular to the crystallographic orientation (111). In the production of nanorods, the average height is estimated to be approximately 30-50 nm, with a density of 2.9×10¹¹ cm⁻² being indicated.

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Publication Details

Journal
East European Journal of Physics
Published
2024-09-02
DOI
https://doi.org/10.26565/2312-4334-2024-3-30
Citations
4
Primary Topic
ZnO doping and properties
Type
article
Field-Weighted Citation Impact
0.47
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article

An Optimized Ultrasonic Spray Pyrolysis Device for The Production of Metal Oxide Films and Their Morfology

Jakhongir N. Usmonov, Akramjon Y. Boboev, С. З. Зайнабидинов, Nuritdin Y. Yunusaliyev
4 citations
East European Journal of Physics
ZnO doping and properties
0.47
article

An Optimized Ultrasonic Spray Pyrolysis Device for The Production of Metal Oxide Films and Their Morfology

Jakhongir N. Usmonov, Akramjon Y. Boboev, С. З. Зайнабидинов, Nuritdin Y. Yunusaliyev
article en
4 citations

Abstract

In this work, we developed an optimized ultrasonic spray pyrolysis device for obtaining metal oxide films. The key benefit of this facility lies in its cost-effectiveness and its ability to consistently coat extensive surfaces without sacrificing the integrity of the semi-conductive films, thus streamlining the manufacturing process of semiconductor films. The resulting films exhibit the following attributes: the thickness of the deposited layer is approximately 400 nm, while the diameters of ZnO1-xSx nanocrystals range from 50 to 200 nm, oriented perpendicular to the crystallographic orientation (111). In the production of nanorods, the average height is estimated to be approximately 30-50 nm, with a density of 2.9×10¹¹ cm⁻² being indicated.

East European Journal of Physics(3)
Andijan State University (UZ), National University of Uzbekistan (UZ)
Openalex Percentile: Top 38%
ZnO doping and properties
0.47
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