Functional Failures in a Sensor Application caused by System-level ESD

This paper reports the functional behavior of a system consisting of a pressure sensor within its sensor module, a two-wire supply with current modulated communication channel and an electronic control unit equivalent during powered system-level ESD tests. It discusses functional recoverable soft-failures, their failure mechanisms and root causes considering overall system properties as well as special electro-mechanical integrated circuit properties, and ESD test requirement and procedures.

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Publication Details

Published
2024-10-07
DOI
https://doi.org/10.1109/emccompo61192.2024.10742014
Primary Topic
Electrostatic Discharge in Electronics
Type
article
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article

Functional Failures in a Sensor Application caused by System-level ESD

Stefan Jahn
Electrostatic Discharge in Electronics
article

Functional Failures in a Sensor Application caused by System-level ESD

Stefan Jahn
article en

Abstract

This paper reports the functional behavior of a system consisting of a pressure sensor within its sensor module, a two-wire supply with current modulated communication channel and an electronic control unit equivalent during powered system-level ESD tests. It discusses functional recoverable soft-failures, their failure mechanisms and root causes considering overall system properties as well as special electro-mechanical integrated circuit properties, and ESD test requirement and procedures.

Infineon Technologies (Germany) (DE)
Openalex Percentile: Top 83%
Electrostatic Discharge in Electronics
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Functional Failures in a Sensor Application caused by System-level ESD — Stefan Jahn · (2024) | TGRS Research Map | TGRS