Design and Application of RFIC Detector: To Measure Coupled Power into IC Pin via PCB Trace
In this paper, we discuss the design of an RF IC detector with eight channels connected to the package pins, designed to determine the incident RF power on each pin. Some of these channels possess different sensitivity levels based on the amplification circuit block they use. A PCB test bench with test tracks has been designed to allow the measurement of RF power coupled to the detector IC pins when illuminated by a RF source. Our discussion will also encompass the applications of the RF IC detector in detecting stochastic EM fields in reverberant or equivalent real-world environments. The key contribution in this paper is the design of RF IC detector which has these applications.
Authors
- Martin P. Robinson (ORCID: https://orcid.org/0000-0003-1767-5541)
- Arunkumar H. Venkateshaiah (ORCID: https://orcid.org/0000-0002-3505-1970)
- J.F. Dawson (ORCID: https://orcid.org/0000-0003-4537-9977)
- Simon J. Bale (ORCID: https://orcid.org/0000-0002-3361-5648)
- Martin A. Trefzer (ORCID: https://orcid.org/0000-0002-6196-6832)
- A.C. Marvin (ORCID: https://orcid.org/0000-0003-2590-5335)
Institutions
- University of York (GB)
Publication Details
- Published
- 2024-10-07
- DOI
- https://doi.org/10.1109/emccompo61192.2024.10742029
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00