Research and Application Progress on Electromagnetic Reliability of Integrated Circuits in the Past Decade
Based on the research of electromagnetic reliability (EMR) related articles in the past decade, this paper reviews the influencing factors, evaluation methods, and research progress of EMR, and explores possible future technological applications and development trends. Finally, the challenges and future prospects of current EMR research were analyzed.
Authors
- Jibin Liu (ORCID: https://orcid.org/0000-0003-0595-3962)
- Changlin Han
- Ledong Chen
- Honghai Liu (ORCID: https://orcid.org/0000-0002-2880-4698)
- Jianfei Wu (ORCID: https://orcid.org/0009-0006-4191-3000)
- Xuesong Wang (ORCID: https://orcid.org/0000-0002-5327-1088)
Institutions
- National University of Defense Technology (CN)
Publication Details
- Published
- 2024-10-07
- DOI
- https://doi.org/10.1109/emccompo61192.2024.10742025
- Primary Topic
- High-Voltage Power Transmission Systems
- Type
- article
- Field-Weighted Citation Impact
- 0.00