Near field scan investigation method to reduce 4.8 GHz emission on a BLE application
The product studied is a low-power, highly secure, single-chip wireless MCU that integrates high-performance Bluetooth Low Energy for Automotive and Industrial applications. During EMC radiated emission test, a peak appeared around 4.8 GHz, due to 2nd harmonic of BLE. EMC lab proposed new investigation method based on near field scan to analyse the peak and try to improve the emission level. This work aims to first understand the origin of the 4.8 GHz peak encounter in RE measurement, then to explain the importance of a good antenna matching network at high frequency and finally to detail the solution found to reduce the emission level.
Authors
- Cécile B. Ménard (ORCID: https://orcid.org/0000-0003-2166-9523)
- Lucy Liu (ORCID: https://orcid.org/0000-0002-7846-9373)
- B. Vrignon
- Jeremy Ruau
- Matthieu Baudry
Publication Details
- Published
- 2024-10-07
- DOI
- https://doi.org/10.1109/emccompo61192.2024.10742054
- Primary Topic
- RFID technology advancements
- Type
- article
- Field-Weighted Citation Impact
- 0.00