EXPERIMENTAL DATA GENERALIZATION OF DELTA ELECTRON YIELD INDUCED BY HIGH ENERGY ELECTRON INTERACTION WITH AMORPHOUS AND SINGLE-CRYSTAL TARGETS

The generalized experimental results of delta electron yield obtained at the NSC KIPT electron accelerators in the energy range from 0.5 MeV to 1.6 GeV are presented. Thin foils of Be, Al, Si, Ni, and Nb were used as experimental targets. It was established in general that delta electron yield is roportional to the product √T∙Z/A, where T is the thickness of the sample in g/cm2 and it has a linear dependence. It is shown that the main factor of delta elec- tron yield increasing is not primary beam energy, but the electron density of the experimental target

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Publication Details

Published
2024-10-25
DOI
https://doi.org/10.46813/2024-153-038
Citations
2
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
Field-Weighted Citation Impact
0.36
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article

EXPERIMENTAL DATA GENERALIZATION OF DELTA ELECTRON YIELD INDUCED BY HIGH ENERGY ELECTRON INTERACTION WITH AMORPHOUS AND SINGLE-CRYSTAL TARGETS

I. Shlyakhov, S. Karpus, T.V. Malykhina, G.D. Kovalenko et al.
2 citations
Electron and X-Ray Spectroscopy Techniques
0.36
article

EXPERIMENTAL DATA GENERALIZATION OF DELTA ELECTRON YIELD INDUCED BY HIGH ENERGY ELECTRON INTERACTION WITH AMORPHOUS AND SINGLE-CRYSTAL TARGETS

I. Shlyakhov, S. Karpus, T.V. Malykhina, G.D. Kovalenko, I.L. Semisalov
article en
2 citations

Abstract

The generalized experimental results of delta electron yield obtained at the NSC KIPT electron accelerators in the energy range from 0.5 MeV to 1.6 GeV are presented. Thin foils of Be, Al, Si, Ni, and Nb were used as experimental targets. It was established in general that delta electron yield is roportional to the product √T∙Z/A, where T is the thickness of the sample in g/cm2 and it has a linear dependence. It is shown that the main factor of delta elec- tron yield increasing is not primary beam energy, but the electron density of the experimental target

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Electron and X-Ray Spectroscopy Techniques
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