A 65-nm Proactive Power Management Technique With Real-Time Machine Learning Engine for Droop Prediction and Mitigation on Microprocessors
A proactive power management (PM) scheme for mitigating dynamic supply droop is proposed with a fully integrated buck converter, an RISC-V CPU core, a real-time machine learning engine (MLE), and a safety droop guardband. The dynamic supply is modeled using an RV32IM ISA CPU and the model was simulated in a customized co-sim environment. The MLE is used to predict the supply droop on a cycle-by-cycle basis for proactive supply regulation from the integrated buck converter through a fast PWM modulation of the power switches. In addition, to deal with the misprediction of MLE and other long-term supply droops that cannot be captured by MLE, a safety droop guardband is implemented to secure the integrity of the supply voltage. The proposed proactive scheme has been implemented on a 65-nm test chip and demonstrated up to 9.9% higher CPU frequency or 9.2% higher power efficiency compared with prior fast digital LDO schemes.
Authors
- Nachiket Desai (ORCID: https://orcid.org/0000-0002-6795-6440)
- Jie Gu (ORCID: https://orcid.org/0000-0003-2912-7294)
- Raveesh Magod (ORCID: https://orcid.org/0000-0003-1014-8802)
- Xin Zhang (ORCID: https://orcid.org/0000-0002-0579-2268)
- Aly Shoukry
- Xi Chen (ORCID: https://orcid.org/0000-0003-3276-2918)
- Jiaxiang Feng
Institutions
- Northwestern University (US)
- Intel (United States) (US)
- IBM Research - Thomas J. Watson Research Center (US)
- Texas Instruments (United States) (US)
Publication Details
- Journal
- IEEE Journal of Solid-State Circuits
- Published
- 2024-11-05
- DOI
- https://doi.org/10.1109/jssc.2024.3479273
- Citations
- 3
- Primary Topic
- VLSI and Analog Circuit Testing
- Type
- article
- Field-Weighted Citation Impact
- 1.47