Investigation of the recrystallization behavior of cold-rolled A1050 thin sheets based on misorientation measurements and grain boundary information

The recrystallization behaviors of severely cold-rolled A1050 thin sheets ( 100 μ m thick) with a reduction area of 98.3% were examined in detail. The thin sheets consisted of elongated and banded grain structures with typical β -fiber (Brass-S-Copper) texture components. Based on electron backscatter diffraction (EBSD), microstructural features such as misorientation measures of the kernel average misorientation (KAM) and grain boundary information of the lattice misorientation angle and axis were characterized. The elongated grains with representative orientations near Copper and S components possessed slightly greater KAM values than those near Brass. During annealing, newly recrystallized grains mainly contained the representative orientations near Copper and S, as opposed to Brass. Low angle grain boundaries (LAGB) observed between the recrystallized and deformed β -fiber grains revealed the occurrence of subgrain growth. The typical recrystallization Cube and Goss textures were also found during annealing. An equi-axed Cube grain growing inside deformed grains with the representative orientation near Copper reveals widespread grain boundary misorientation. An ellipsoidal Goss texture grows up along the two deformed bands with equivalent near-S orientations. One band is mainly consumed by Goss, and the other band prevents it from growing inward by means of grain boundaries with 60 ∘ 〈 111 〉 . Various grain boundary misorientations reveal the dynamic evolution of the newly recrystallized grains.