Analysis of Leaky Integrate-and-Fire Neuron Using Al<sub>2</sub>O<sub>3</sub>/Si<sub>3</sub>N<sub>4</sub> Gate Insulator Stack for Spiking Neural Network

Leaky integrate-and-fire (LIF)-based spiking neural networks (SNNs) are analyzed using a field-effect transistor (FET)-type neuron device with a charge trap insulator stack (Al2O3/Si3N4). By using both the memory functionality and the poor retention characteristic of the device, we successfully implemented the LIF function. SPICE modeling of the device and LIF circuit demonstrated that the large membrane capacitor in a neuron circuit could be replaced, which promises a smaller area and lower energy consumption (∼0.3 pJ/spike). Based on the measured properties, spiking neural networks are simulated to find the optimal leaky constant while maintaining a low operational voltage.

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Publication Details

Journal
ACS Applied Electronic Materials
Published
2024-11-04
DOI
https://doi.org/10.1021/acsaelm.4c01408
Citations
1
Primary Topic
Advanced Memory and Neural Computing
Type
article
Field-Weighted Citation Impact
0.21

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article

Analysis of Leaky Integrate-and-Fire Neuron Using Al2O3/Si3N4 Gate Insulator Stack for Spiking Neural Network

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1 citations
ACS Applied Electronic Materials
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article

Analysis of Leaky Integrate-and-Fire Neuron Using Al2O3/Si3N4 Gate Insulator Stack for Spiking Neural Network

Joon Hwang, Jong‐Ho Bae, Jonghyun Ko, Jong‐Ho Lee, Jeonghyun Kim, Minkyu Park
article en
1 citations

Abstract

Leaky integrate-and-fire (LIF)-based spiking neural networks (SNNs) are analyzed using a field-effect transistor (FET)-type neuron device with a charge trap insulator stack (Al2O3/Si3N4). By using both the memory functionality and the poor retention characteristic of the device, we successfully implemented the LIF function. SPICE modeling of the device and LIF circuit demonstrated that the large membrane capacitor in a neuron circuit could be replaced, which promises a smaller area and lower energy consumption (∼0.3 pJ/spike). Based on the measured properties, spiking neural networks are simulated to find the optimal leaky constant while maintaining a low operational voltage.

ACS Applied Electronic MaterialsVol. 6(11)
Kookmin University (KR), Seoul National University (KR)
National Research Foundation of Korea
Openalex Percentile: Top 46%
Advanced Memory and Neural Computing
0.21
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