Analysis of Leaky Integrate-and-Fire Neuron Using Al<sub>2</sub>O<sub>3</sub>/Si<sub>3</sub>N<sub>4</sub> Gate Insulator Stack for Spiking Neural Network
Leaky integrate-and-fire (LIF)-based spiking neural networks (SNNs) are analyzed using a field-effect transistor (FET)-type neuron device with a charge trap insulator stack (Al2O3/Si3N4). By using both the memory functionality and the poor retention characteristic of the device, we successfully implemented the LIF function. SPICE modeling of the device and LIF circuit demonstrated that the large membrane capacitor in a neuron circuit could be replaced, which promises a smaller area and lower energy consumption (∼0.3 pJ/spike). Based on the measured properties, spiking neural networks are simulated to find the optimal leaky constant while maintaining a low operational voltage.
Authors
- Joon Hwang (ORCID: https://orcid.org/0000-0003-2998-8174)
- Jong‐Ho Bae (ORCID: https://orcid.org/0000-0002-1786-7132)
- Jonghyun Ko (ORCID: https://orcid.org/0000-0001-5641-2352)
- Jong‐Ho Lee (ORCID: https://orcid.org/0000-0003-3559-9802)
- Jeonghyun Kim (ORCID: https://orcid.org/0000-0001-6839-5721)
- Minkyu Park (ORCID: https://orcid.org/0000-0002-1426-1944)
Institutions
- Kookmin University (KR)
- Seoul National University (KR)
Publication Details
- Journal
- ACS Applied Electronic Materials
- Published
- 2024-11-04
- DOI
- https://doi.org/10.1021/acsaelm.4c01408
- Citations
- 1
- Primary Topic
- Advanced Memory and Neural Computing
- Type
- article
- Field-Weighted Citation Impact
- 0.21
Funders
- National Research Foundation of Korea