Longitudinal Piezoelectricity and Polarization‐Insensitive Oxidation in Janus vdWs Nb<sub>3</sub>SeI<sub>7</sub>
As a newly discovered Janus van der Waals (vdW) material, semiconducting Nb<sub>3</sub>SeI<sub>7</sub> offers several notable advantages, including spontaneous out-of-plane polarization, facile exfoliation to the monolayer limit, and significant out-of-plane emission dipole in second harmonic generation. These properties make it a promising candidate for piezoelectric and piezophototronic applications in highly efficient energy conversion. However, Nb<sub>3</sub>SeI<sub>7</sub> is prone to oxidation when exposed to oxygen, which can severely limit the exploration and utilization of these intriguing physical properties. Therefore, understanding the oxidation mechanism of pristine Nb<sub>3</sub>SeI<sub>7</sub> and its correlation with electrical polarization-an area that remains largely unexplored-is highly significant. In this study, the out-of-plane piezoelectricity of Nb<sub>3</sub>SeI<sub>7</sub> is experimentally demonstrated, with a piezoelectric coefficient (|d<sub>33</sub> <sup>eff</sup>|) of 0.76 nm V<sup>-1</sup>. Furthermore, by combining near ambient-pressure X-ray photoelectron spectroscopy (NAP-XPS), Time-of-Flight secondary ion mass spectrometry (ToF-SIMS), and Density functional theory (DFT) calculations, it is revealed that the oxidation of Nb<sub>3</sub>SeI<sub>7</sub> is self-limiting and independent of its electrical polarization, owing to the similar defect formation energies of Se and I atoms. This self-limiting and polarization-insensitive oxidation provides valuable insights into the stabilization mechanisms and expands the potential applications of out-of-plane piezoelectricity and other intriguing physical properties in Janus vdW Nb<sub>3</sub>SeI<sub>7</sub>.
Authors
- Cheng‐Yan Xu (ORCID: https://orcid.org/0000-0002-7835-6635)
- Shen Lin (ORCID: https://orcid.org/0000-0003-1043-7647)
- Fuqiang Huang (ORCID: https://orcid.org/0000-0003-0526-5473)
- Bo Gao (ORCID: https://orcid.org/0000-0002-6670-0232)
- Jiafan Qu (ORCID: https://orcid.org/0009-0004-7467-4830)
- Gaoyang Gou (ORCID: https://orcid.org/0000-0003-1485-8115)
- Xiaojia Yuan (ORCID: https://orcid.org/0000-0001-8584-121X)
- Yang Li (ORCID: https://orcid.org/0009-0005-9836-2556)
- Lu You (ORCID: https://orcid.org/0000-0002-0474-0415)
- Yuqiang Fang (ORCID: https://orcid.org/0000-0001-7259-9823)
- Jierui Fu
- Yue Liu (ORCID: https://orcid.org/0000-0002-5625-0602)
- Zhipeng Li (ORCID: https://orcid.org/0000-0003-1115-1077)
- Jiapeng Wang (ORCID: https://orcid.org/0009-0006-9371-9680)
- Jun Cai (ORCID: https://orcid.org/0000-0002-3806-7230)
- Xinfeng Chen (ORCID: https://orcid.org/0000-0003-2579-273X)
- Zhengbo Zhong
- Liang Zhen
Institutions
- Shanghai Jiao Tong University (CN)
- Harbin Institute of Technology (CN)
- ShanghaiTech University (CN)
- Nanjing University of Science and Technology (CN)
- Soochow University (CN)
- Shanghai Advanced Research Institute (CN)
- Xi'an Jiaotong University (CN)
Publication Details
- Journal
- Small
- Published
- 2024-11-03
- DOI
- https://doi.org/10.1002/smll.202408628
- Citations
- 1
- Primary Topic
- MXene and MAX Phase Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.12
Funders
- National Natural Science Foundation of China
- Suzhou Municipal Science and Technology Bureau
- National Key Research and Development Program of China