Influence of Parasitic Elements on Flyback Converter at High Switching Frequency Operation: A Comprehensive Analysis
The presence of parasitic elements in the flyback converter amplifies the impact on the converter’s primary current quality, particularly when the converter's switching frequency exceeds its designated operational rate. In this paper, the parasitic and stray elements of the transformer have been comprehensively examined, modelled, and simulated to evaluate their influence on the converter, with specific emphasis on the primary current. The simulation was performed utilising MATLAB SIMULINK software, integrating the authentic critical characteristics of the components, and conducting tests at various switching frequencies. The simulation results indicate that the primary current exhibits pronounced resonance effects at higher switching frequencies. The experimental findings are presented to corroborate the theoretical analysis and simulations pertaining to the impact of parasitic elements on the transformer and its immediate environment.
Authors
- Faridah Hanim Mohd Noh (ORCID: https://orcid.org/0000-0001-5328-6098)
- Mohd Amran Mohd Radzi (ORCID: https://orcid.org/0000-0003-3785-1573)
- Muhamad Faizal Yaakub (ORCID: https://orcid.org/0000-0002-8246-7397)
- Ahmed Naji Zaidan
- Norhafiz Azis (ORCID: https://orcid.org/0000-0002-9669-569X)
Institutions
- Universiti Putra Malaysia (MY)
- Iraqi University (IQ)
- Technical University of Malaysia Malacca (MY)
- Tun Hussein Onn University of Malaysia (MY)
Publication Details
- Journal
- Journal of Advanced Research in Applied Sciences and Engineering Technology
- Published
- 2024-10-09
- DOI
- https://doi.org/10.37934/araset.58.1.220230
- Citations
- 2
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.42