Optical Calibration of a Multi-Color Ellipsometric Mapping Tool Fabricated Using Cheap Parts

We developed and applied a new calibration method to make more accurate measurements with our multi-color ellipsometric mapping tool made from cheap parts. Ellipsometry is an optical technique that measures the relative change in the polarization state of the measurement beam induced by reflection from or transmission through a sample. During conventional ellipsometric measurement, the data collection is relatively slow and measures one spot at a time, so mapping needs a long time compared with our new optical mapping equipment made by an ordinary color LED monitor and a polarization-sensitive camera. The angle of incidence and the incident polarization state is varied point by point, so a special optical calibration method is needed. Three SiO2 samples with different thicknesses were used for the point-by-point determination of the angle of incidence and rho (ρ) corrections. After the calibration, another SiO2 sample was measured and analyzed using the calibrated corrections; further, this sample was independently measured using a conventional spectroscopic ellipsometer. The difference between the two measured thickness maps is less than 1 nm. Our optical mapping tool made from cheap parts is faster and covers wider area samples relative to conventional ellipsometers, and these correction enhancements further demonstrate its performance.