Scanning Electron Microscopy Applied to RF Primary Reference Standards
A novel method for characterizing the diameter of inner conductors in high-frequency coaxial air lines is presented. It is based on scanning electron microscopy and can be seen as a complement to the use of laser micrometers, offering its own distinct advantages. The proposed method was implemented and tested in an international comparison as part of an EMPIR project.
Authors
- G. Monasterios
- John Campbell (ORCID: https://orcid.org/0000-0003-1712-4774)
- Martin Musumano
- Maria Soledad Pereda
Institutions
- National Institute of Industrial Technology (AR)
Publication Details
- Published
- 2024-09-18
- DOI
- https://doi.org/10.1109/argencon62399.2024.10735857
- Primary Topic
- Electron and X-Ray Spectroscopy Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00