Scanning Electron Microscopy Applied to RF Primary Reference Standards

A novel method for characterizing the diameter of inner conductors in high-frequency coaxial air lines is presented. It is based on scanning electron microscopy and can be seen as a complement to the use of laser micrometers, offering its own distinct advantages. The proposed method was implemented and tested in an international comparison as part of an EMPIR project.

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Publication Details

Published
2024-09-18
DOI
https://doi.org/10.1109/argencon62399.2024.10735857
Primary Topic
Electron and X-Ray Spectroscopy Techniques
Type
article
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article

Scanning Electron Microscopy Applied to RF Primary Reference Standards

G. Monasterios, John Campbell, Martin Musumano, Maria Soledad Pereda
Electron and X-Ray Spectroscopy Techniques
article

Scanning Electron Microscopy Applied to RF Primary Reference Standards

G. Monasterios, John Campbell, Martin Musumano, Maria Soledad Pereda
article en

Abstract

A novel method for characterizing the diameter of inner conductors in high-frequency coaxial air lines is presented. It is based on scanning electron microscopy and can be seen as a complement to the use of laser micrometers, offering its own distinct advantages. The proposed method was implemented and tested in an international comparison as part of an EMPIR project.

National Institute of Industrial Technology (AR)
Openalex Percentile: Top 81%
Electron and X-Ray Spectroscopy Techniques
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Scanning Electron Microscopy Applied to RF Primary Reference Standards — G. Monasterios, John Campbell, et al. · (2024) | TGRS Research Map | TGRS