Internal Electrostatic Discharge Modeling: Validation and Fitting Using Tests on Insulated Wires
Electron beam tests were conducted to observe the internal electrostatic discharge behavior of four wire samples arcing into three termination resistors. The charging environment during the test was also simulated using 3-D NUMIT to calculate the expected voltage development within each wire. The impedances of the wires and the test setup were measured and included in a circuit model of the discharging wire connected to the measurement circuit. The circuit model was fit to the largest discharge observed on a 50 Ω load. The circuit model was then used to simulate discharges into 5 kΩ and 10 MΩ terminations, and the simulated pulses were compared to observed pulses on those terminations. Simulated peak voltages agree with observed voltages to within a factor of 1.6 and simulated decay times agree with observed decay times to within a factor of 2.3. For large pulses, derived source voltages range from 3.7 to 15.5 kV, derived source capacitances range from 4 to 11 pF, and derived source resistances range from 1100 to 3500 Ω.
Authors
- James Chinn (ORCID: https://orcid.org/0000-0002-2991-3052)
- Dennis Thorbourn (ORCID: https://orcid.org/0000-0002-0713-5819)
- Wousik Kim (ORCID: https://orcid.org/0000-0001-5914-658X)
- Allen Andersen (ORCID: https://orcid.org/0000-0002-2966-3364)
- Eduardo Martin
Institutions
- California Institute of Technology (US)
Publication Details
- Journal
- Journal of Spacecraft and Rockets
- Published
- 2024-10-31
- DOI
- https://doi.org/10.2514/1.a36031
- Citations
- 1
- Primary Topic
- High voltage insulation and dielectric phenomena
- Type
- article
- Field-Weighted Citation Impact
- 0.12
Funders
- Jet Propulsion Laboratory