Development of High-Quality SAM on Sapphire Pseudosubstrate by SPE for Long-Wavelength LEDs
One of the main challenges in achieving long-wavelength InGaN-based emitters is their large lattice mismatch, around 11% between InN and GaN. ScAlMgO4 (SAM) is lattice-matched with In0.17Ga0.83N, which allows the growth of high indium composition InGaN films with good quality. Using solid-phase epitaxy (SPE) of SAM on a sapphire substrate, SAM films can be achieved at any wafer size with greatly reduced cost while keeping their lattice-matched properties. In this work, we have achieved smooth InGaN films grown on SAM on sapphire with similar morphology as InGaN films deposited on free-standing native SAM substrates. Moreover, we have demonstrated the first InGaN-based green LED on SAM on a sapphire substrate with a peak emission wavelength at 525 nm and ∼9 nm of blue shift.
Authors
- Shubhra S. Pasayat
- Surjava Sanyal
- Guangying Wang (ORCID: https://orcid.org/0000-0002-4278-3037)
- Moon J. Kim (ORCID: https://orcid.org/0000-0002-2972-493X)
- Shuwen Xie
- Sam Oliyai
Institutions
- University of Wisconsin–Madison (US)
- The University of Texas at Dallas (US)
Publication Details
- Journal
- Crystal Growth & Design
- Published
- 2024-10-31
- DOI
- https://doi.org/10.1021/acs.cgd.4c00990
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Office of Naval Research
- Division of Electrical, Communications and Cyber Systems