Chromatic confocal displacement measurement using a double-sided phase diffractive lens

A chromatic confocal displacement measurement (CCDM) system using a double-sided phase diffractive lens (DPDL) is demonstrated. The DPDL is designed to produce a strong dispersion, minimize the optical structure and reduce the difficulty of fabrication and assembly, in addition to reducing the weight and size of the probe of the CCDM. A CCDM experimental system was set up based on the DPDL, and the results of the measurement experiments show that the axial measurement range of the CCDM system reaches 9.463 mm in the working wavelength range (500-700 nm), the relative error is less than 0.022% and the axial resolution near the designed focal length is better than 0.5 µm.

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Publication Details

Journal
Optics Express
Published
2024-10-31
DOI
https://doi.org/10.1364/oe.543130
Citations
3
Primary Topic
Optical measurement and interference techniques
Type
article
Field-Weighted Citation Impact
0.75
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Chromatic confocal displacement measurement using a double-sided phase diffractive lens

Chen Lin, Yulong Wang, Xi Hou, Jie Li et al.
3 citations
Optics Express
Optical measurement and interference techniques
0.75
article

Chromatic confocal displacement measurement using a double-sided phase diffractive lens

Chen Lin, Yulong Wang, Xi Hou, Jie Li, Xin Liu
article en
3 citations

Abstract

A chromatic confocal displacement measurement (CCDM) system using a double-sided phase diffractive lens (DPDL) is demonstrated. The DPDL is designed to produce a strong dispersion, minimize the optical structure and reduce the difficulty of fabrication and assembly, in addition to reducing the weight and size of the probe of the CCDM. A CCDM experimental system was set up based on the DPDL, and the results of the measurement experiments show that the axial measurement range of the CCDM system reaches 9.463 mm in the working wavelength range (500-700 nm), the relative error is less than 0.022% and the axial resolution near the designed focal length is better than 0.5 µm.

Optics ExpressVol. 32(24)
Chinese Academy of Sciences (CN), Institute of Optics and Electronics, Chinese Academy of Sciences (CN), University of Chinese Academy of Sciences (CN)
Affordable and clean energy
Openalex Percentile: Top 27%
Optical measurement and interference techniques
0.75
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