Multi-resolution gratings for edge illumination x-ray phase contrast imaging: a simulation study

Edge-illumination (EI) is an established x-ray phase-contrast imaging method that relies on gratings to obtain attenuation, differential phase and dark field contrast. Current EI setups, however, have a limited geometric flexibility. That is, the gratings are designed for a fixed magnification and the period and aperture size of the sample grating determine the resolution. To enable multi-resolution EI, we propose an alternative design of the sample grating. Specifically, we introduce a grating with an adaptive period that allows multiresolution EI, and demonstrate this concept with Monte-carlo simulations of a resolution phantom at different magnifications.

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Publication Details

Published
2024-10-31
DOI
https://doi.org/10.1117/12.3025968
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
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article

Multi-resolution gratings for edge illumination x-ray phase contrast imaging: a simulation study

Pieter-Jan Vanthienen, Jan De Beenhouwer, Nicholas Francken, Jan Sijbers
Advanced X-ray Imaging Techniques
article

Multi-resolution gratings for edge illumination x-ray phase contrast imaging: a simulation study

Pieter-Jan Vanthienen, Jan De Beenhouwer, Nicholas Francken, Jan Sijbers
article en

Abstract

Edge-illumination (EI) is an established x-ray phase-contrast imaging method that relies on gratings to obtain attenuation, differential phase and dark field contrast. Current EI setups, however, have a limited geometric flexibility. That is, the gratings are designed for a fixed magnification and the period and aperture size of the sample grating determine the resolution. To enable multi-resolution EI, we propose an alternative design of the sample grating. Specifically, we introduce a grating with an adaptive period that allows multiresolution EI, and demonstrate this concept with Monte-carlo simulations of a resolution phantom at different magnifications.

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