New and Accurate Self-Test Methods for Offset Error of 10-Bit SAR-ADC
Nonideality features like offset error may affect the absolute quantization range of the Successive Approximation Register (SAR) ADC. This can cause the SAR ADC's performance to be lower than in high-precision applications. This article proposes offset error mitigation methods to reduce the conversion range error in ADC systems. The suggested approaches include three primary stages: error modeling, error detection, and correction for offset error. This approach's simplicity of use, rapidity, and flexibility are its primary drivers for development. We tested the correctness of the results using an approach that uses sinusoidal waveforms as the analog input signal. The method improves offset errors by 0.98.7%. ENOB improved to 9.6, and the SNR achieved 58.7 dB. The key benefits of the suggested strategy are flexibility, simplicity, efficiency, and speed.
Authors
- Qais Al-Gayem (ORCID: https://orcid.org/0000-0002-7056-3349)
- Mohammed Abdulmahdi Mohammedali
Institutions
- University of Babylon (IQ)
- Al-Furat Al-Awsat Technical University (IQ)
Publication Details
- Published
- 2024-08-29
- DOI
- https://doi.org/10.1109/icitisee63424.2024.10730534
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00