Temperature Calibrated K-Band Noise Source Employing a COTS Si-Ge HBT

In this paper a mm-Wave, temperature-calibrated K-band noise source built with commercial on-the-shelf (COTS) components is demonstrated. The proposed source includes a Si-Ge Heterojunction Bipolar Transistor (HBT) using its base-emitter (BE) junction driven into avalanche breakdown, as the main noise-generating element. Excess Noise Ratio (ENR) values reaching 10.8 dB were obtained with a 6.71 mA breakdown current, in a 24 GHz to 32 GHz bandwidth and a 21 °C to 102 °C device temperature excursion, with no impedance matching. A calibration model is also provided, which fits ENR magnitude with an average error less than 0.05 dB, when considering the maximum current and temperature ranges. An ENR drift error of 0.8 dB was instead reported for the uncalibrated source.

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Published
2024-09-23
DOI
https://doi.org/10.23919/eumic61603.2024.10732730
Citations
1
Primary Topic
Radio Frequency Integrated Circuit Design
Type
article
Field-Weighted Citation Impact
0.21
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article

Temperature Calibrated K-Band Noise Source Employing a COTS Si-Ge HBT

Giovanni Collodi, Marco Badii, Monica Righini, Alessandro Cidronali
1 citations
Radio Frequency Integrated Circuit Design
0.21
article

Temperature Calibrated K-Band Noise Source Employing a COTS Si-Ge HBT

Giovanni Collodi, Marco Badii, Monica Righini, Alessandro Cidronali
article en
1 citations

Abstract

In this paper a mm-Wave, temperature-calibrated K-band noise source built with commercial on-the-shelf (COTS) components is demonstrated. The proposed source includes a Si-Ge Heterojunction Bipolar Transistor (HBT) using its base-emitter (BE) junction driven into avalanche breakdown, as the main noise-generating element. Excess Noise Ratio (ENR) values reaching 10.8 dB were obtained with a 6.71 mA breakdown current, in a 24 GHz to 32 GHz bandwidth and a 21 °C to 102 °C device temperature excursion, with no impedance matching. A calibration model is also provided, which fits ENR magnitude with an average error less than 0.05 dB, when considering the maximum current and temperature ranges. An ENR drift error of 0.8 dB was instead reported for the uncalibrated source.

University of Florence (IT)
Affordable and clean energy
Openalex Percentile: Top 47%
Radio Frequency Integrated Circuit Design
0.21
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