Automated Characterisation of Printed Electronics Under Adjustable Ambient Conditions

By means of functional printing, a variety of electronic devices (e.g. passives, semiconductors, sensors) and entire circuits can be printed. One field of application are flexible electronics. But the protection from environmental influences like humidity or oxygen is still a challenge. Often, encapsulation methods known from conventional semiconductor manufacturing can not be applied. Thus, new encapsulation materials and processes have to be developed and validated. To facilitate this manually very time-consuming task, an automated measurement setup for electrical characterisation of printed electronics under adjustable ambient conditions is introduced.

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Publication Details

Published
2024-10-09
DOI
https://doi.org/10.1109/cas62834.2024.10736741
Citations
1
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
0.35
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Automated Characterisation of Printed Electronics Under Adjustable Ambient Conditions

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Automated Characterisation of Printed Electronics Under Adjustable Ambient Conditions

Joachim R. Binder, Ulrich Gengenbach, Tim P. Mach, Markus Reischl, Klaus‐Martin Reichert, Martin Ungerer, Liane Koker, Zehua Chen, Moritz Lindmüller
article en
1 citations

Abstract

By means of functional printing, a variety of electronic devices (e.g. passives, semiconductors, sensors) and entire circuits can be printed. One field of application are flexible electronics. But the protection from environmental influences like humidity or oxygen is still a challenge. Often, encapsulation methods known from conventional semiconductor manufacturing can not be applied. Thus, new encapsulation materials and processes have to be developed and validated. To facilitate this manually very time-consuming task, an automated measurement setup for electrical characterisation of printed electronics under adjustable ambient conditions is introduced.

Karlsruhe Institute of Technology (DE)
Climate action
Openalex Percentile: Top 34%
Industrial Vision Systems and Defect Detection
0.35
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