Advanced Protection Functions for Smart IGBT Gate Drivers are Paving the Road to Damage-Free Systems
This paper proposes protection functions integrated in a galvanically isolated gate driver (GIGD). The architecture provides prompt detection of an overcurrent (OC) condition of the power device and an Under Voltage Lock Out (UVLO) event for the negative supply. Moreover, the proposed concept includes a thermal management circuit that shuts down the GIGD operation at increased temperature. The proposed protection functions were integrated in a 0.25 μm BCD technology, as part of a galvanically isolated gate driver. Experimental results showcase the correct functionality.
Authors
- Ines Hurez
- Victor Bricicaru
- Vlad Anghel (ORCID: https://orcid.org/0000-0002-6377-3110)
- Alexandra Banu (ORCID: https://orcid.org/0000-0002-6724-9914)
- Florin Drăghici (ORCID: https://orcid.org/0000-0001-8889-8115)
- Sebastian Stamate
Institutions
- Universitatea Națională de Știință și Tehnologie Politehnica București (RO)
Publication Details
- Published
- 2024-10-09
- DOI
- https://doi.org/10.1109/cas62834.2024.10736767
- Primary Topic
- Electrostatic Discharge in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00