THE POSSIBILITIES OF OPTIMIZING THE OPERATING MODE OF CMOS DIGITAL INTEGRATED CIRCUITS FOR MEASURING THEIR TRANSIENT THERMAL CHARACTERISTICS

The results of measurements of the transient thermal characteristics (TTC) of CMOS digital integrated circuits (DIC) for using the voltage out low and voltage out high as temperature-sensitive parameters (TSP) are presented. Options for improving the accuracy of measuring the CMOS TTC DIC at a low supply voltage are considered.

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Publication Details

Published
2024-10-21
DOI
https://doi.org/10.61527/appfe-2024.25-27
Primary Topic
Sensor Technology and Measurement Systems
Type
article
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article

THE POSSIBILITIES OF OPTIMIZING THE OPERATING MODE OF CMOS DIGITAL INTEGRATED CIRCUITS FOR MEASURING THEIR TRANSIENT THERMAL CHARACTERISTICS

В. А. Сергеев, Alexey Chertoriysky, M.V. Trukhin
Sensor Technology and Measurement Systems
article

THE POSSIBILITIES OF OPTIMIZING THE OPERATING MODE OF CMOS DIGITAL INTEGRATED CIRCUITS FOR MEASURING THEIR TRANSIENT THERMAL CHARACTERISTICS

В. А. Сергеев, Alexey Chertoriysky, M.V. Trukhin
article en

Abstract

The results of measurements of the transient thermal characteristics (TTC) of CMOS digital integrated circuits (DIC) for using the voltage out low and voltage out high as temperature-sensitive parameters (TSP) are presented. Options for improving the accuracy of measuring the CMOS TTC DIC at a low supply voltage are considered.

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THE POSSIBILITIES OF OPTIMIZING THE OPERATING MODE OF CMOS DIGITAL INTEGRATED CIRCUITS FOR MEASURING THEIR TRANSIENT THERMAL CHARACTERISTICS — В. А. Сергеев, Alexey Chertoriysky, et al. · (2024) | TGRS Research Map | TGRS