LOW-FREQUENCY NOISE METER FOR SEMICONDUCTOR DEVICES

Noise parameters in many cases are the most important characteristics of semiconductor devices, in particular field-effect transistors, since they determine the sensitivity limit of electronic devices designed to register weak signals. Such devices are necessary, for example, in various automation systems, optoelectronic devices, all kinds of instruments for physical research, devices for acoustic measurements, medical and biotechnics, household radio equipment, etc. The requirements of various fields of modern technology are increasingly expanding this list. Field effect transistors are widely used devices, therefore, the analysis of their noise is an urgent task.