Online Health Monitoring of Electronic Components Subjected to Repeated High-Energy Shock
Abstract Electronic components that undergo shock and vibration are susceptible to failure caused by damage in the base printed circuit board that makes up the substrate of these systems. In certain applications, it may become paramount to know in real-time if the electronic components are damaged to enable a next-generation active system to take immediate responses. Broad examples of such systems include blast mitigation systems or safety systems in car accidents. These systems on classified under the term “high-rate” as they experience high shock levels on short time scales. This work proposes a long short-term memory neural network to enable real-time damage detection and assessment of electronic assemblies subjected to shock. The long short-term memory neural network is able to infer the state of the structure in approximately 4 milliseconds following the impact. The model obtains perfect classification results at 4 milliseconds for the data used in this work. This work is supported by experimentation that indicates damage to electronic packages can be quantified through the in situ monitoring of the impedance of electrical connections. Changes in impedance correlate to alterations in the physical properties of electronic components which indicate the occurrence of damage. On this basis, a comprehensive dataset is created to monitor the impedance changes of a daisy-chained connection through repeated high-energy shocks. Meanwhile, the shock response of the electronic components is captured using an accelerometer, enabling a detailed analysis of the effects of high-rate shock on the components’ performance. A dataset is developed to encompass 30 repeated impacts experiencing 10,000 gn during impact with an average half-sine time of 322 microseconds. The paper outlines the proposed real-time machine learning framework while performance metrics are presented and discussed in detail.
Authors
- Austin Downey (ORCID: https://orcid.org/0000-0002-5524-2416)
- Joud N. Satme (ORCID: https://orcid.org/0000-0002-6769-8234)
- Daniel Coble
Institutions
- University of South Carolina (US)
Publication Details
- Published
- 2024-09-09
- DOI
- https://doi.org/10.1115/smasis2024-139950
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00