Scalable Model, Parameter Extraction of GaN Schottky Barrier Diode (SBD) and Its Application in C-Band Limiter Design

In this article, a scalable model of thin-barrier lateral heterojunction AlGaN/GaN Schottky barrier diode (SBD) for RF simulation is proposed. By comparing the measured and modeled S-parameters under multibias bias conditions, it is verified that the scaling rule dependent on the effective junction area of the device can better predict the performance of large-size devices in the frequency range of 0.1–20 GHz. In addition, the C-band limiter is successfully designed by using the scalable SBD model. The physical and simulated S-parameters have good consistency, which further verifies the accuracy of the model.

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Publication Details

Journal
IEEE Transactions on Electron Devices
Published
2024-10-28
DOI
https://doi.org/10.1109/ted.2024.3479155
Citations
2
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
0.62

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article

Scalable Model, Parameter Extraction of GaN Schottky Barrier Diode (SBD) and Its Application in C-Band Limiter Design

Ao Zhang, Xuanwu Kang, Zhenglin Zhang, Rikang Zhao et al.
2 citations
IEEE Transactions on Electron Devices
GaN-based semiconductor devices and materials
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article

Scalable Model, Parameter Extraction of GaN Schottky Barrier Diode (SBD) and Its Application in C-Band Limiter Design

Ao Zhang, Xuanwu Kang, Zhenglin Zhang, Rikang Zhao, Yuyan Huang, Jianjun Gao, Ke Wei, Yingkui Zheng, Xinyu Liu, Hao Wu, Guoxiang Zhang
article en
2 citations

Abstract

In this article, a scalable model of thin-barrier lateral heterojunction AlGaN/GaN Schottky barrier diode (SBD) for RF simulation is proposed. By comparing the measured and modeled S-parameters under multibias bias conditions, it is verified that the scaling rule dependent on the effective junction area of the device can better predict the performance of large-size devices in the frequency range of 0.1–20 GHz. In addition, the C-band limiter is successfully designed by using the scalable SBD model. The physical and simulated S-parameters have good consistency, which further verifies the accuracy of the model.

IEEE Transactions on Electron DevicesVol. 71(12)
Chinese Academy of Sciences (CN), Nantong University (CN), Institute of Microelectronics (CN), East China Normal University (CN), Shandong University of Science and Technology (CN)
Youth Innovation Promotion Association of the Chinese Academy of Sciences
Openalex Percentile: Top 32%
GaN-based semiconductor devices and materials
0.62
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