Representation Learning Based on Co-Evolutionary Combined With Probability Distribution Optimization for Precise Defect Location

Visual defect detection methods based on representation learning play an important role in industrial scenarios. Defect detection technology based on representation learning has made significant progress. However, existing defect detection methods still face three challenges: first, the extreme scarcity of industrial defect samples makes training difficult. Second, due to the characteristics of industrial defects, such as blur and background interference, it is challenging to obtain fuzzy defect separation edges and context information. Third, industrial defects cannot obtain accurate positioning information. This article proposes feature co-evolution interaction architecture (CIA) and glass container defect dataset to address the above challenges. Specifically, the contributions of this article are as follows: first, this article designs a glass container image acquisition system that combines RGB and polarization information to create a glass container defect dataset containing more than 60000 samples to alleviate the sample scarcity problem in industrial scenarios. Subsequently, this article designs the CIA. CIA optimizes the probability distribution of features through the co-evolution of edge and context features, thereby improving detection accuracy in blurred defects and noisy environments. Finally, this article proposes a novel inforced IoU loss (IIoU loss), which can obtain more accurate position information by being aware of the scale changes of the predicted box. Defect detection experiments in three mainstream industrial manufacturing categories (Northeastern University (NEU)-Det, glass containers, wood) show that CIA only uses 22.5 GFLOPs, and mean average precision (mAP) (NEU-Det: 88.74%, glass containers: 95.38%, wood: 68.42%) outperforms state-of-the-art methods.

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Publication Details

Journal
IEEE Transactions on Neural Networks and Learning Systems
Published
2024-10-28
DOI
https://doi.org/10.1109/tnnls.2024.3479734
Citations
5
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
1.74
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article

Representation Learning Based on Co-Evolutionary Combined With Probability Distribution Optimization for Precise Defect Location

Zekai Zhang, Weiyu Li, Shengyong Chen, Gang Li et al.
5 citations
IEEE Transactions on Neural Networks and Learning Systems
Industrial Vision Systems and Defect Detection
1.74
article

Representation Learning Based on Co-Evolutionary Combined With Probability Distribution Optimization for Precise Defect Location

Zekai Zhang, Weiyu Li, Shengyong Chen, Gang Li, Moulin Xiong, Siyi Ding, Wenhao Zhang, Jinglin Zhang, Qinghui Chen
article en
5 citations

Abstract

Visual defect detection methods based on representation learning play an important role in industrial scenarios. Defect detection technology based on representation learning has made significant progress. However, existing defect detection methods still face three challenges: first, the extreme scarcity of industrial defect samples makes training difficult. Second, due to the characteristics of industrial defects, such as blur and background interference, it is challenging to obtain fuzzy defect separation edges and context information. Third, industrial defects cannot obtain accurate positioning information. This article proposes feature co-evolution interaction architecture (CIA) and glass container defect dataset to address the above challenges. Specifically, the contributions of this article are as follows: first, this article designs a glass container image acquisition system that combines RGB and polarization information to create a glass container defect dataset containing more than 60000 samples to alleviate the sample scarcity problem in industrial scenarios. Subsequently, this article designs the CIA. CIA optimizes the probability distribution of features through the co-evolution of edge and context features, thereby improving detection accuracy in blurred defects and noisy environments. Finally, this article proposes a novel inforced IoU loss (IIoU loss), which can obtain more accurate position information by being aware of the scale changes of the predicted box. Defect detection experiments in three mainstream industrial manufacturing categories (Northeastern University (NEU)-Det, glass containers, wood) show that CIA only uses 22.5 GFLOPs, and mean average precision (mAP) (NEU-Det: 88.74%, glass containers: 95.38%, wood: 68.42%) outperforms state-of-the-art methods.

IEEE Transactions on Neural Networks and Learning SystemsVol. 36(7)
Tianjin University of Technology (CN), Qilu University of Technology (CN), Shandong University (CN), China Institute of Finance and Capital Markets (CN), Shandong Academy of Sciences (CN)
Reduced inequalities
Openalex Percentile: Top 14%
Industrial Vision Systems and Defect Detection
1.74
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