The structure and formation of non-volatile memory cells of Superflash
Split-gate embedded Flash memory technology has been around for decades and has become the standard for a wide range of devices, such as microcontrollers and smart cards. Among the, due to a number of advantages, Silicon Storage Technology Super Flash non-volatile memory technology has become the most widespread. This article presents the results of a study of the memory cells structure, examines in detail the principle of their operation and the main technological stages of the production process of forming transistor structures.
Authors
- Р. А. Милованов
- Д. А. Абдуллаев (ORCID: https://orcid.org/0000-0003-2100-9736)
- E. V. Bobrova
Institutions
- Russian Academy of Sciences (RU)
- Institute of Nanotechnology (GB)
Publication Details
- Journal
- Микроэлектроника
- Published
- 2024-10-27
- DOI
- https://doi.org/10.31857/s0544126924030061
- Primary Topic
- Advanced Memory and Neural Computing
- Type
- article
- Field-Weighted Citation Impact
- 0.00