Hybrid <scp>TLM</scp>‐<scp>CTLM</scp> Test Structure for Determining Specific Contact Resistivity of Ohmic Contacts

ABSTRACT Various test structures can be used to determine the specific contact resistivity of ohmic contacts. The transmission line model test structure and circular transmission line model test structure are the most commonly used. The analytical expressions of the former are straightforward and effectively describe the electrical behaviour of a contact, while the concentric geometry of the latter eliminates complications during fabrication. In this article, we present a hybrid test structure that combines the advantages of the transmission line and the circular transmission line models. The analytical expressions of the new structure are presented, and its finite‐element modelling is undertaken. The effect of contact geometry on this test structure is also discussed. Using the presented test structure, determining contact parameters does not require any error corrections.

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Publication Details

Journal
International Journal of Numerical Modelling Electronic Networks Devices and Fields
Published
2024-10-26
DOI
https://doi.org/10.1002/jnm.3310
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
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article

Hybrid TLM‐CTLM Test Structure for Determining Specific Contact Resistivity of Ohmic Contacts

Yue Pan, Anthony S. Holland
International Journal of Numerical Modelling Electronic Networks Devices and Fields
Integrated Circuits and Semiconductor Failure Analysis
article

Hybrid TLM‐CTLM Test Structure for Determining Specific Contact Resistivity of Ohmic Contacts

Yue Pan, Anthony S. Holland
article en

Abstract

ABSTRACT Various test structures can be used to determine the specific contact resistivity of ohmic contacts. The transmission line model test structure and circular transmission line model test structure are the most commonly used. The analytical expressions of the former are straightforward and effectively describe the electrical behaviour of a contact, while the concentric geometry of the latter eliminates complications during fabrication. In this article, we present a hybrid test structure that combines the advantages of the transmission line and the circular transmission line models. The analytical expressions of the new structure are presented, and its finite‐element modelling is undertaken. The effect of contact geometry on this test structure is also discussed. Using the presented test structure, determining contact parameters does not require any error corrections.

International Journal of Numerical Modelling Electronic Networks Devices and FieldsVol. 37(6)
RMIT Vietnam (VN), RMIT University (AU)
Openalex Percentile: Top 83%
Integrated Circuits and Semiconductor Failure Analysis
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