Saliency-Guided Fine-Grained Temporal Mask Learning for Few-Shot Action Recognition
Temporal relation modeling is one of the core aspects of few-shot action recognition. Most previous works mainly focus on temporal relation modeling based on coarse-level actions, without considering the atomic action details and fine-grained temporal information. This oversight represents a significant limitation in this task. Specifically, coarse-level temporal relation modeling can make the few-shot models overfit in high-discrepancy temporal context, and ignore the low-discrepancy but high-semantic relevance action details in the video. To address these issues, we propose a saliency-guided fine-grained temporal mask learning method that models the temporal atomic action relation for few-shot action recognition in a finer manner. First, to model the comprehensive temporal relations of video instances, we design a temporal mask learning architecture to automatically search for the best matching of each atomic action snippet. Next, to exploit the low-discrepancy atomic action features, we introduce a saliency-guided temporal mask module to adaptively locate and excavate the atomic action information. After that, the few-shot predictions can be obtained by feeding the embedded rich temporal-relation features to a common feature matcher. Extensive experimental results on standard datasets demonstrate our method's superior performance compared to existing state-of-the-art methods.
Authors
- Ronghua Liang (ORCID: https://orcid.org/0000-0003-2077-9608)
- Ruohong Huan (ORCID: https://orcid.org/0000-0003-2555-343X)
- Yuanjie Dang (ORCID: https://orcid.org/0000-0002-8302-1338)
- Shuo Zheng
- Dongdong Zhao (ORCID: https://orcid.org/0000-0001-6032-5083)
- Peng Chen (ORCID: https://orcid.org/0000-0001-6122-0574)
Institutions
- Zhejiang University of Technology (CN)
Publication Details
- Published
- 2024-10-26
- DOI
- https://doi.org/10.1145/3664647.3681200
- Primary Topic
- Human Pose and Action Recognition
- Type
- article
- Field-Weighted Citation Impact
- 0.00