Research on Au-In Flip-Chip Bonding Process of 2300 PPI Micro-LED Arrays

In this article, a 0.52-in <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1056\times 586$ </tex-math></inline-formula> green micro-LED array with 2300 PPI and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$10.8~\mu $ </tex-math></inline-formula>m pixel pitch was integrated with the substrate by Au-In flip-chip bonding. Through the analysis and comparison of the performance of the micro-LED devices at different bonding conditions, the temperature and pressure could significantly affect the optical performance of micro-LED and the strength of the bump connections. The experimental results indicate that the micro-LED device achieved the highest brightness and brightness uniformity at the bonding condition of 180 °C–6 kg, with an average brightness of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$6.7\times 10^{{4}}$ </tex-math></inline-formula> cd/m2 and a brightness uniformity of 59.3% at 3 V. Further analysis shows that the turn-on voltage of the micro-LED was about 2.7 V, and the ON-resistance was about <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.99~\Omega $ </tex-math></inline-formula>. Moreover, the full width at half maximum (FWHM) spanned from 28.1 to 29.8 nm, accompanied by a peak wavelength fluctuation of 3.6 nm. Additionally, the shear force of the micro-LED devices and the intermetallic compound (IMC) composition of the fractured surface of the indium bumps at different bonding conditions were analyzed. The shear force increased with rising bonding temperature and was notably enhanced by increasing the pressure at lower bonding temperatures. Through SEM and energy dispersive X-ray spectroscopy (EDS) analysis, AuIn2 was the primary IMC formed in the bonding process, which further confirmed that the formation of IMC was closely related to the bonding strength.

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Publication Details

Journal
IEEE Transactions on Electron Devices
Published
2024-10-25
DOI
https://doi.org/10.1109/ted.2024.3470769
Citations
6
Primary Topic
3D IC and TSV technologies
Type
article
Field-Weighted Citation Impact
1.25

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article

Research on Au-In Flip-Chip Bonding Process of 2300 PPI Micro-LED Arrays

Luqiao Yin, Xiuzhen Lu, Xiaoxiao Ji, Haojie Zhou et al.
6 citations
IEEE Transactions on Electron Devices
3D IC and TSV technologies
1.25
article

Research on Au-In Flip-Chip Bonding Process of 2300 PPI Micro-LED Arrays

Luqiao Yin, Xiuzhen Lu, Xiaoxiao Ji, Haojie Zhou, Jianxin Li, Zhu Yang, Jianhua Zhang, Xinyi Wang
article en
6 citations

Abstract

In this article, a 0.52-in <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1056\times 586$ </tex-math></inline-formula> green micro-LED array with 2300 PPI and <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$10.8~\mu $ </tex-math></inline-formula>m pixel pitch was integrated with the substrate by Au-In flip-chip bonding. Through the analysis and comparison of the performance of the micro-LED devices at different bonding conditions, the temperature and pressure could significantly affect the optical performance of micro-LED and the strength of the bump connections. The experimental results indicate that the micro-LED device achieved the highest brightness and brightness uniformity at the bonding condition of 180 °C–6 kg, with an average brightness of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$6.7\times 10^{{4}}$ </tex-math></inline-formula> cd/m2 and a brightness uniformity of 59.3% at 3 V. Further analysis shows that the turn-on voltage of the micro-LED was about 2.7 V, and the ON-resistance was about <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.99~\Omega $ </tex-math></inline-formula>. Moreover, the full width at half maximum (FWHM) spanned from 28.1 to 29.8 nm, accompanied by a peak wavelength fluctuation of 3.6 nm. Additionally, the shear force of the micro-LED devices and the intermetallic compound (IMC) composition of the fractured surface of the indium bumps at different bonding conditions were analyzed. The shear force increased with rising bonding temperature and was notably enhanced by increasing the pressure at lower bonding temperatures. Through SEM and energy dispersive X-ray spectroscopy (EDS) analysis, AuIn2 was the primary IMC formed in the bonding process, which further confirmed that the formation of IMC was closely related to the bonding strength.

IEEE Transactions on Electron DevicesVol. 71(12)
Shanghai University (CN)
National Key Research and Development Program of China
Affordable and clean energy
Openalex Percentile: Top 20%
3D IC and TSV technologies
1.25
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