High-Performance UV Detector Using Al-Doped ZnO Phototransistor Prepared by Initiated-CVD Doping Technique
A novel doping technique with an initiated chemical vapor deposition (iCVD) process is applied to fabricate aluminum (Al)-doped zinc oxide (ZnO) channel thin-film ultraviolet (UV) phototransistor (PT). The iCVD doping technique can successfully introduce Al throughout the ZnO channel without any surface damage. The sub-bandgap states mainly due to oxygen vacancy (VO) defects in the ZnO channel are effectively suppressed by Al doping; the subthreshold swing (SS) of the PT has been reduced by more than half to 168 mV/dec and under negative gate bias illumination stress, the threshold voltage shift is reduced by about half to −2.03 V, which improves the reliability. For the UV detection, the Al-doped ZnO PT exhibits a high responsivity of 358.93 A<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\cdot $ </tex-math></inline-formula> W−1, an ultrahigh UV-to-visible rejection ratio of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$4.81\times 10^{{6}}$ </tex-math></inline-formula>, a high detectivity (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${D} ^{\ast } $ </tex-math></inline-formula>) of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.68\times 10^{{15}}$ </tex-math></inline-formula> Jones, a low noise equivalent power (NEP) of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.98\times 10^{-{18}}$ </tex-math></inline-formula> W<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\cdot $ </tex-math></inline-formula> Hz−1, and fast switching performance. The developed Al-doped ZnO PT can be used in low-cost and high-performed UV detection for various applications.
Authors
- Myunghun Shin (ORCID: https://orcid.org/0000-0003-3790-4022)
- Jongsu Baek (ORCID: https://orcid.org/0009-0004-8675-5689)
- Youngbin Yoon (ORCID: https://orcid.org/0000-0002-8067-9601)
- Yoon-Ho Choi (ORCID: https://orcid.org/0000-0002-3556-5082)
- Dong‐Bin Kim (ORCID: https://orcid.org/0000-0002-0219-190X)
- Min Ju Kim (ORCID: https://orcid.org/0000-0002-2415-6996)
- Heetae Kim (ORCID: https://orcid.org/0000-0002-9078-5547)
- Yong-Ki Kim (ORCID: https://orcid.org/0009-0009-9142-5533)
- Byung Jin Cho
Institutions
- Korea Advanced Institute of Science and Technology (KR)
- Korea Aerospace University (KR)
- Dankook University (KR)
Publication Details
- Journal
- IEEE Transactions on Electron Devices
- Published
- 2024-10-25
- DOI
- https://doi.org/10.1109/ted.2024.3481208
- Citations
- 3
- Primary Topic
- GaN-based semiconductor devices and materials
- Type
- article
- Field-Weighted Citation Impact
- 0.93
Funders
- Ministry of Trade, Industry and Energy