High-Performance UV Detector Using Al-Doped ZnO Phototransistor Prepared by Initiated-CVD Doping Technique

A novel doping technique with an initiated chemical vapor deposition (iCVD) process is applied to fabricate aluminum (Al)-doped zinc oxide (ZnO) channel thin-film ultraviolet (UV) phototransistor (PT). The iCVD doping technique can successfully introduce Al throughout the ZnO channel without any surface damage. The sub-bandgap states mainly due to oxygen vacancy (VO) defects in the ZnO channel are effectively suppressed by Al doping; the subthreshold swing (SS) of the PT has been reduced by more than half to 168 mV/dec and under negative gate bias illumination stress, the threshold voltage shift is reduced by about half to −2.03 V, which improves the reliability. For the UV detection, the Al-doped ZnO PT exhibits a high responsivity of 358.93 A<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\cdot $ </tex-math></inline-formula> W−1, an ultrahigh UV-to-visible rejection ratio of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$4.81\times 10^{{6}}$ </tex-math></inline-formula>, a high detectivity (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${D} ^{\ast } $ </tex-math></inline-formula>) of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.68\times 10^{{15}}$ </tex-math></inline-formula> Jones, a low noise equivalent power (NEP) of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.98\times 10^{-{18}}$ </tex-math></inline-formula> W<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\cdot $ </tex-math></inline-formula> Hz−1, and fast switching performance. The developed Al-doped ZnO PT can be used in low-cost and high-performed UV detection for various applications.

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Publication Details

Journal
IEEE Transactions on Electron Devices
Published
2024-10-25
DOI
https://doi.org/10.1109/ted.2024.3481208
Citations
3
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
0.93

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article

High-Performance UV Detector Using Al-Doped ZnO Phototransistor Prepared by Initiated-CVD Doping Technique

Myunghun Shin, Jongsu Baek, Youngbin Yoon, Yoon-Ho Choi et al.
3 citations
IEEE Transactions on Electron Devices
GaN-based semiconductor devices and materials
0.93
article

High-Performance UV Detector Using Al-Doped ZnO Phototransistor Prepared by Initiated-CVD Doping Technique

Myunghun Shin, Jongsu Baek, Youngbin Yoon, Yoon-Ho Choi, Dong‐Bin Kim, Min Ju Kim, Heetae Kim, Yong-Ki Kim, Byung Jin Cho
article en
3 citations

Abstract

A novel doping technique with an initiated chemical vapor deposition (iCVD) process is applied to fabricate aluminum (Al)-doped zinc oxide (ZnO) channel thin-film ultraviolet (UV) phototransistor (PT). The iCVD doping technique can successfully introduce Al throughout the ZnO channel without any surface damage. The sub-bandgap states mainly due to oxygen vacancy (VO) defects in the ZnO channel are effectively suppressed by Al doping; the subthreshold swing (SS) of the PT has been reduced by more than half to 168 mV/dec and under negative gate bias illumination stress, the threshold voltage shift is reduced by about half to −2.03 V, which improves the reliability. For the UV detection, the Al-doped ZnO PT exhibits a high responsivity of 358.93 A<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\cdot $ </tex-math></inline-formula> W−1, an ultrahigh UV-to-visible rejection ratio of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$4.81\times 10^{{6}}$ </tex-math></inline-formula>, a high detectivity (<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${D} ^{\ast } $ </tex-math></inline-formula>) of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.68\times 10^{{15}}$ </tex-math></inline-formula> Jones, a low noise equivalent power (NEP) of <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$2.98\times 10^{-{18}}$ </tex-math></inline-formula> W<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$\cdot $ </tex-math></inline-formula> Hz−1, and fast switching performance. The developed Al-doped ZnO PT can be used in low-cost and high-performed UV detection for various applications.

IEEE Transactions on Electron DevicesVol. 71(12)
Korea Advanced Institute of Science and Technology (KR), Korea Aerospace University (KR), Dankook University (KR)
Ministry of Trade, Industry and Energy
Openalex Percentile: Top 26%
GaN-based semiconductor devices and materials
0.93
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